Illustrated with concrete application cases in Medical, Cosmetics, Agribusiness / Agrocultural, Automotive, Smart Cities / Smart Building, Industry 4.0...the conferences will enable visitors to understand the new challenges of the market, to discover the new solutions and technologies in Measurement, Vision, Photonics and Electronics and to draw on best practices.
The conferences will be organized in partnership with key actors such as the FRENCH PROTOTYPING ASSOCIATION, CAP'TRONIC, EUROPEAN MACHINE VISION ASSOCIATION (EMVA), THEMATYS, Jean-Luc BODNAR (University of Reims Champagne Ardenne)… around themes such as: Additive Manufacturing, 3D Printing, Non Destructive Testing, Optics & Lighting, Camera Technology, 3D Vision, Factory 4.0, Lifi, Augmented Reality, Cybersecurity, 5G, etc.
The program of the conferences will be available at the end of June.
In conjunction with ENOVA PARIS, the 18th International Metrology Congress (CIM) organized by the French College of Metrology will be the place for technical exchanges between all actors in the measurement world with 1,000 participants from 50 countries: users of measuring instruments of all industries, laboratories and organizations; quality and reliability managers, managers and decision-makers; manufacturers of measuring equipment and service providers; teachers and researchers. It will present the evolutions of measurement techniques, advances in R&D and practical applications. It will show how the measure contributes to improve its measurement, analysis and testing processes and to control its risks.
Complete program and registration available soon.